Polarization contrast in photon scanning tunnelling microscopy combined with atomic force microscopy

Keysight Technologies Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy

Atomic Force Microscopy Application in Biological Research: A Review Study

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

Atomic species identification at the (101) anatase surface by simultaneous scanning tunnelling and atomic force microscopy

Anatase is a pivotal material in devices for energy-harvesting applications and catalysis. Methods for the accurate characterization of this reducible oxide at the atomic scale are critical in the exploration of outstanding properties for technological developments. Here we combine atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), supported by first-principles calculations...

Determination of three-dimensional structure in photon scanning tunnelling microscopy

We present an analytic solution to the problem of determining three-dimensional object structure, described by the spatial dependence of the susceptibility, from data accessible through photon scanning tunnelling microscopy (PSTM) experiments. An analysis is presented of the scattering of evanescent waves with detection of the scattered field by a probe in the near zone of the scatterer. The re...

Combining Atomic Force Microscopy and Laser Scanning Confocal Microscopy

Introduction The visualisation of sample elements using various forms of microscopy relies not only on magnification but also contrast. As such, differing forms of microscopy offer different information about a sample. Laser scanning confocal microscopy (LSCM) provides information about the 3D location of a particular, labelled component within a sample and has the additional advantage of exclu...